{"created":"2023-06-26T10:41:24.432732+00:00","id":1982,"links":{},"metadata":{"_buckets":{"deposit":"3fb4c056-7ada-4597-9cc4-b7fff13880e9"},"_deposit":{"created_by":15,"id":"1982","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"1982"},"status":"published"},"_oai":{"id":"oai:hi-tech.repo.nii.ac.jp:00001982","sets":["15:172"]},"author_link":["2792"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1988-02-28","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"140","bibliographicPageStart":"134","bibliographicVolumeNumber":"7","bibliographic_titles":[{"bibliographic_title":"八戸工業大学紀要"},{"bibliographic_title":"The Bulletin of Hachinohe Institute of Technology","bibliographic_titleLang":"en"}]}]},"item_10002_description_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_description":"120005891874","subitem_description_type":"Other"}]},"item_10002_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{"familyName":"内山","familyNameLang":"ja"},{"familyName":"ウチヤマ","familyNameLang":"ja-Kana"},{"familyName":"UCHIYAMA","familyNameLang":"en"}],"givenNames":[{"givenName":"晴夫","givenNameLang":"ja"},{"givenName":"ハルオ","givenNameLang":"ja-Kana"},{"givenName":"Haruo","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"2792","nameIdentifierScheme":"WEKO"}],"names":[{"name":"内山, 晴夫","nameLang":"ja"},{"name":"ウチヤマ, ハルオ","nameLang":"ja-Kana"},{"name":"UCHIYAMA, Haruo","nameLang":"en"}]}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"八戸工業大学"}]},"item_10002_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"八戸工業大学"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.hi-tech.ac.jp/","subitem_relation_type_select":"URI"}}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00205113","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"0287-1866","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":"","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"内山, 晴夫","creatorNameLang":"ja"},{"creatorName":"ウチヤマ, ハルオ","creatorNameLang":"ja-Kana"},{"creatorName":"UCHIYAMA, Haruo","creatorNameLang":"en"}],"familyNames":[{"familyName":"内山","familyNameLang":"ja"},{"familyName":"ウチヤマ","familyNameLang":"ja-Kana"},{"familyName":"UCHIYAMA","familyNameLang":"en"}],"givenNames":[{"givenName":"晴夫","givenNameLang":"ja"},{"givenName":"ハルオ","givenNameLang":"ja-Kana"},{"givenName":"Haruo","givenNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"2792","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2012-07-10"}],"displaytype":"detail","filename":"01_07_134-140_1.pdf","filesize":[{"value":"65.9 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"01_07_134-140_1","url":"https://hi-tech.repo.nii.ac.jp/record/1982/files/01_07_134-140_1.pdf"},"version_id":"8b79c420-cbf9-4c33-9150-0cd71acecaad"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"半導体ガス・センサの温湿度補償法に関する二,三の実験的検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"半導体ガス・センサの温湿度補償法に関する二,三の実験的検討"},{"subitem_title":"Experimental considerations for compensating temperature and humidity dependence of semiconductor gas sensors","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"15","path":["172"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-06-07"},"publish_date":"2012-06-07","publish_status":"0","recid":"1982","relation_version_is_last":true,"title":["半導体ガス・センサの温湿度補償法に関する二,三の実験的検討"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-12-19T07:10:49.048701+00:00"}