{"created":"2023-06-26T10:41:35.807987+00:00","id":2387,"links":{},"metadata":{"_buckets":{"deposit":"275bb60b-bf3f-4055-a335-7f4c92fec2ce"},"_deposit":{"created_by":15,"id":"2387","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"2387"},"status":"published"},"_oai":{"id":"oai:hi-tech.repo.nii.ac.jp:00002387","sets":["442:452"]},"author_link":["379","8250"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-02-28","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"41","bibliographicPageStart":"37","bibliographic_titles":[{},{}]}]},"item_10002_description_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_description":"110004623027","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"We studied the optics property of a ferroelectric thin film. Ferroelectric thin films of (PbLa)(ZrTi)O_3 (PLZT) were prepared by chemical solution deposition (CSD) method. The PLZT thin film is multi layer structure and has the extinction and refractive index. We measured the wave length dependence of reflectance spectrum and compared the Sellmeier model and the tauc-Lorenz model to the experimental data. As a result,the maximum value of refractive index of a PLZT thin film is 4.1 (wave length : 280 nm). The Sellmeier model is the simple model and the value obtained from the Sellmeier model is not fitting to measured value in short wave length region, because the Sellmeier model disregards absorbing photon by band gap of PLZT thin film. Therefore, in short wave length region the tauc-Lorenz model is effective.","subitem_description_type":"Abstract"}]},"item_10002_full_name_3":{"attribute_name":"著者別名","attribute_value_mlt":[{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[]}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}],"names":[{},{},{}]},{"affiliations":[{"affiliationNames":[{"affiliationName":"","lang":"ja"}],"nameIdentifiers":[{"nameIdentifier":"","nameIdentifierScheme":"ISNI","nameIdentifierURI":"http://www.isni.org/isni/"}]}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}],"names":[{},{},{}]}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"八戸工業大学"}]},"item_10002_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"八戸工業大学"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.hi-tech.ac.jp/","subitem_relation_type_select":"URI"}}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11823440","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1347958X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"Echizen, Masahiro","creatorNameLang":"en"},{"creatorName":"越前, 正洋","creatorNameLang":"ja"},{"creatorName":"エチゼン, マサヒロ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"MASUDA, Yoichiro","creatorNameLang":"en"},{"creatorName":"増田, 陽一郎","creatorNameLang":"ja"},{"creatorName":"マスダ, ヨウイチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2012-07-20"}],"displaytype":"detail","filename":"02_04_037-041.pdf","filesize":[{"value":"484.3 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"02_04_037-041","url":"https://hi-tech.repo.nii.ac.jp/record/2387/files/02_04_037-041.pdf"},"version_id":"d77aaf25-8308-409c-8224-68a1dcd2dffd"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"PLZT薄膜"},{"subitem_subject":"多層薄膜"},{"subitem_subject":"Tauc-Lorenzの分散"},{"subitem_subject":"Sellmeierの分散"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Sol-Gel法により合成した(PbLa)(ZrTi)O3強誘電体薄膜の光学特性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Sol-Gel法により合成した(PbLa)(ZrTi)O3強誘電体薄膜の光学特性"},{"subitem_title":"Optics Property of (PbLa) (ZrTi)O3 Ferroelectric Thin Film by Sol-Gel Method","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"15","path":["452"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-06-07"},"publish_date":"2012-06-07","publish_status":"0","recid":"2387","relation_version_is_last":true,"title":["Sol-Gel法により合成した(PbLa)(ZrTi)O3強誘電体薄膜の光学特性"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-12-19T07:03:55.040999+00:00"}