{"created":"2023-06-26T10:41:37.286258+00:00","id":2414,"links":{},"metadata":{"_buckets":{"deposit":"5576e89d-c32e-4945-83e9-078298c01a03"},"_deposit":{"created_by":15,"id":"2414","owners":[15],"pid":{"revision_id":0,"type":"depid","value":"2414"},"status":"published"},"_oai":{"id":"oai:hi-tech.repo.nii.ac.jp:00002414","sets":["442:450"]},"author_link":["379","3115","8146","3114"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-02-27","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"24","bibliographicPageStart":"19","bibliographic_titles":[{},{}]}]},"item_10002_description_12":{"attribute_name":"論文ID（NAID）","attribute_value_mlt":[{"subitem_description":"110004323742","subitem_description_type":"Other"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"八戸工業大学異分野融合科学研究所"}]},"item_10002_relation_17":{"attribute_name":"関連サイト","attribute_value_mlt":[{"subitem_relation_name":[{"subitem_relation_name_text":"八戸工業大学"}],"subitem_relation_type_id":{"subitem_relation_type_id_text":"http://www.hi-tech.ac.jp/","subitem_relation_type_select":"URI"}}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11823440","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1347958X","subitem_source_identifier_type":"ISSN"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNameIdentifiers":[{"affiliationNameIdentifier":""}],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"MASUDA, Yoichiro","creatorNameLang":"en"},{"creatorName":"増田, 陽一郎","creatorNameLang":"ja"},{"creatorName":"マスダ, ヨウイチロウ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{},{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"NOZAKA, Takashi","creatorNameLang":"en"},{"creatorName":"野坂, 隆","creatorNameLang":"ja"},{"creatorName":"ノザカ, タカシ","creatorNameLang":"ja-Kana"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"増本, 博","creatorNameLang":"ja"},{"creatorName":"マスモト, ヒロシ","creatorNameLang":"ja-Kana"},{"creatorName":"MASUMOTO, Hiroshi","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]},{"creatorAffiliations":[{"affiliationNameIdentifiers":[],"affiliationNames":[{"affiliationName":""}]}],"creatorNames":[{"creatorName":"後藤, 孝","creatorNameLang":"ja"},{"creatorName":"ゴトウ, タカシ","creatorNameLang":"ja-Kana"},{"creatorName":"GOTO, Takashi","creatorNameLang":"en"}],"familyNames":[{},{},{}],"givenNames":[{},{},{}],"nameIdentifiers":[{}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2012-07-20"}],"displaytype":"detail","filename":"02_02_019-024.pdf","filesize":[{"value":"482.4 kB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"02_02_019-024","url":"https://hi-tech.repo.nii.ac.jp/record/2414/files/02_02_019-024.pdf"},"version_id":"6b60d030-e5bf-4ec0-9c1a-78aa8837f3a6"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Ferroelectric_thin_film"},{"subitem_subject":"chemical_solution_deposition"},{"subitem_subject":"leakage_current_density"},{"subitem_subject":"fatigue"},{"subitem_subject":"upper_electrodes_of_platinum_(Pt)"},{"subitem_subject":"SrRuO3_(SRO)_and_IrO2"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Leakage Current Properties of PZT Thin Film Capacitors","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Leakage Current Properties of PZT Thin Film Capacitors"},{"subitem_title":"Leakage Current Properties of PZT Thin Film Capacitors","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"15","path":["450"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-06-07"},"publish_date":"2012-06-07","publish_status":"0","recid":"2414","relation_version_is_last":true,"title":["Leakage Current Properties of PZT Thin Film Capacitors"],"weko_creator_id":"15","weko_shared_id":-1},"updated":"2023-12-19T07:03:07.649733+00:00"}