{"created":"2023-06-26T10:42:42.035052+00:00","id":4119,"links":{},"metadata":{"_buckets":{"deposit":"9caa40ce-7f79-4044-9184-fee4cc30adb7"},"_deposit":{"created_by":16,"id":"4119","owner":"2","owners":[16],"pid":{"revision_id":0,"type":"depid","value":"4119"},"status":"published"},"_oai":{"id":"oai:hi-tech.repo.nii.ac.jp:00004119","sets":["15:567"]},"author_link":[],"item_9_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2023-03-31","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"126","bibliographicPageStart":"109","bibliographicVolumeNumber":"42"}]},"item_9_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.32127/0000004119","subitem_identifier_reg_type":"JaLC"}]},"item_9_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"八戸工業大学","subitem_publisher_language":"ja"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorAffiliations":[{"affiliationNames":[{"affiliationName":"八戸工業大学","affiliationNameLang":"ja"}]}],"creatorNames":[{"creatorName":"柴田, 幸司","creatorNameLang":"ja"},{"creatorName":"シバタ, コウジ","creatorNameLang":"ja-Kana"},{"creatorName":"SHIBATA, Koji","creatorNameLang":"en"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-05-24"}],"displaytype":"detail","filename":"01_42_109-126.pdf","filesize":[{"value":"1.4 MB"}],"format":"application/pdf","licensetype":"license_11","mimetype":"application/pdf","url":{"label":"01_42_109-126","url":"https://hi-tech.repo.nii.ac.jp/record/4119/files/01_42_109-126.pdf"},"version_id":"f44d733d-7c5b-49b3-b9ab-a600241abb65"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"Dielectric measurement","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"liquid","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"coaxial line","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cut-off waveguide","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"cylindrical cavity resonator","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"mode-matching technique","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"mode-matching method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"modal analysis","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"eigenmode expansion","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electromagnetic analysis","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"measurement standards","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"Dielectric Measurement of  Liquids Based on the Open-Ended Coaxial Line Reflection Method","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Dielectric Measurement of  Liquids Based on the Open-Ended Coaxial Line Reflection Method","subitem_title_language":"en"}]},"item_type_id":"9","owner":"16","path":["567"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-05-24"},"publish_date":"2023-05-24","publish_status":"0","recid":"4119","relation_version_is_last":true,"title":["Dielectric Measurement of  Liquids Based on the Open-Ended Coaxial Line Reflection Method"],"weko_creator_id":"16","weko_shared_id":-1},"updated":"2025-04-14T08:47:55.085495+00:00"}